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Advanced Mathematical and Computational Tools in Metrology and Testing IX

E. Pavese, et al, editors
Publisher: 
World Scientific
Publication Date: 
2012
Number of Pages: 
450
Format: 
Hardcover
Series: 
Series on Advances in Matheamtics for Applied Sciences 84
Price: 
168.00
ISBN: 
9789814397940
Category: 
Proceedings
We do not plan to review this book.
  • Recommended Tools for Sensitivity Analysis Associated to the Evaluation of Measurement Uncertainty (A Allard and N Fischer)
  • Case Study of Likelihood and Bayes Approaches for Measurement Based on Nonlinear Regression (A Bariska and R Bürgin)
  • Uncertainty Modeling in 3D SEM Stereophotogrammetry (L Carli, M Galetto and G Genta)
  • Software to Support the Use of GUM Supplement 2 — Extension to Any Number of Output Quantities (M G Cox, P M Harris and I M Smith)
  • Probabilistic Characterization of Face Measurement (F Crenna, G B Rossi and L Bovio)
  • Modeling Expert Knowledge to Assign Consensus Values in Proficiency Tests (S Demeyer and N Fischer)
  • A Two-Stage MCM/MCMC Algorithm for Uncertainty Evaluation (A B Forbes)
  • Data Fusion Techniques for Cylindrical Surface Measurements (M Galovska, R Tutsch and O Jusko)
  • Stochastic Modeling Aspects for an Improved Solution of the Inverse Problem in Scatterometry (H Gross, M-A Henn, A Rathsfeld and M Bär)
  • On the Difference of Meanings of “Zero Correction”: Zero Value Versus No Correction, and of the Associated Uncertainties (F Pavese)
  • Uncertainty & Risks in Decision-Making in Qualitative Measurement: An Information-Theoretical Approach (L R Pendrill)
  • Theory of AND Computation Program for Determination of the Reference Value in Key Comparisons Based on Bayesian Statistics (K Shirono, H Tanaka and K Ehara)
  • and other papers

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